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Ships within 48 hours · Estimated delivery Aug 20 - Aug 25
Max EL = 500 nm
High quality probe manufactured at Bruker AFM Probes
5 Back Angle: 25 ± 2
A pack of 10 High quality etched silicon probes for contact mode imaging in air
Round Re-Entrant Tips for 3-D imaging
APSH-0050 Automated AFM Max EL = 500 nmCP II sample bias holder DESCRIPTION Sample bias holder for CPII Innova has connectors to apply an external sample bias voltage. This type of sample holder is used to hold a flat sample, such as a piece of semiconductor material. The Sample Bias Holder is included in the Scanning Capacitance Microscopy (SCM) option.
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