MagneticMulti75-G Wafer Screws used are M3 x

Screws used are M3 x 6mm

Handling of scratch sensitive samples

- Nanomechanical mapping with FFV or PFQNM on Dimension Icon

Magnification Reference Standard & Stage Micrometer

It also holds two FIB grids conveniently close to the sample to mount and prepare TEM lamellae on the FIB grid for subsequent TEM imaging

MagneticMulti75-G Wafer Screws used are M3 xHard Magnetic, Medium Momentum AFM Probe DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Hard Magnetic, Medium Momentum AFM Probe Monolithic silicon AFM probe for magnetic force microscopy (MFM). The cobalt alloy coated tip has a magnetic moment of roughly 10^ 13 emu and coercivity of roughly 300 Oe. The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and