Pay in 4 interest-free payments of $43.50 Learn more
Ships within 48 hours · Estimated delivery Aug 10 - Aug 15
Microscopists and engineers using high performance SEMs or FIB systems will find this calibration test specimen useful
Based on the measurement of 9 different standards
The Cobalt-Chromium reflective coating on the backside of the cantilever increases the laser signal (A+B) by up to 2
PELCO® Grid Size
This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model RESP-40
AC-SPK 292 kHz Microscopists and engineers using highDESCRIPTION This kit contains a selection of parts often used to mount samples for AFM based analysis. The kit contains 20 12mm steel sample pucks, a sheet of 50 adhesive dots for adhering the sample to the steel pucks, and tweezers.
