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Max Overhang = 30 nm
SPECIFICATIONS
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packed in anti-static vials
RFESP-190 NanoIR Probes Max Overhang = 30 nm35N m, 190kHz, Symmetric Tip, No Coatings, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of 10 High quality etched silicon probes for soft TappingMode imaging and force modulation in air. Unmounted for use on standard AFM's. Bruker's flagship MPP probes are the preferred choice for high sensitivity silicon probe imaging in TappingMode or non contact mode in air. Every aspect of the MPP design has been optimized to provide the
US$ 724.50
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