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RFESP-190 NanoIR Probes Max Overhang = 30 nm

SKU: 63574842330

4.3
USD285.47 USD334.47

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Ships within 48 hours · Estimated delivery Aug 14 - Aug 19

Description

Max Overhang = 30 nm

SPECIFICATIONS

We do it correctly

Introduction

packed in anti-static vials

RFESP-190 NanoIR Probes Max Overhang = 30 nm35N m, 190kHz, Symmetric Tip, No Coatings, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of 10 High quality etched silicon probes for soft TappingMode imaging and force modulation in air. Unmounted for use on standard AFM's. Bruker's flagship MPP probes are the preferred choice for high sensitivity silicon probe imaging in TappingMode or non contact mode in air. Every aspect of the MPP design has been optimized to provide the

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

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