SCM-PTSI 15 nm · This sample provides excellent

· This sample provides excellent contrast in elastic modulus

UK (counterpart of NIST)

Boot for Second Generation Dimension EC Cell

which might move during study when held with a tape or disc adhesive

but available as a spare part

SCM-PTSI 15 nm · This sample provides excellent2. 8N m, 75kHz, 4 Sided Tip, Conductive PtSi Coating DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Bruker SCM PtSi Probes For the highest resolution nanoelectrical measurements with outstanding wear resistance. Bruker's new platinum silicide AFM probe is the ideal choice for Scanning Capacitance Microscopy measurements on the most advanced semiconductor features, providing the highest resolution imaging and long tip lifetime due to its