Pay in 4 interest-free payments of $22.51 Learn more
Ships within 48 hours · Estimated delivery Aug 17 - Aug 22
it saves time and it avoids introduction of preparation artifacts
The reflex side of the cantilever has a Co-Cr coating for increased reflectivity up to 2
The central area may be used for AFM measurements
With this mount there is no need to tilt the SEM specimen stage which avoids drift and enables quick setup for EBSD analysis
individually certified against a NIST standard with features from 2
Low Profile Metallographic Mount Holder Size:1-1/2" and 38-40mm it saves time and itDESCRIPTION SEM Pin Mount Specimen Holdersfor Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain
US$ 628.33
US$ 122.50
US$ 200.00
US$ 129.99
