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MICA StrataTek™ TEM Grids 6H-SiC (0001) based calibration sample

SKU: 27262071892

4.3
USD145.00 USD175.00

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Ships within 48 hours · Estimated delivery Aug 17 - Aug 22

Description

6H-SiC (0001) based calibration sample which is designed to perform easy calibrations of an AFM scanner's vertical movements in several nanometers interval

Bar Width: 25 microns

The largest pattern has an overall dimension of 8mm square with lines and spaces of 250µm

-- Seals cell against FFKM boot (EC-V2-CH BOOT) upon engage

This will only show the central features and can be viewed with secondary and backscattered electrons

MICA StrataTek™ TEM Grids 6H-SiC (0001) based calibration sampleAFM sample Mica disks, 12mm DESCRIPTION Mica sample disks are useful as a sample substrate (especially for biological samples) and as an atomic resolution standard. They are 12mm in diameter, grade V 1 Ruby Muscovite. Contains quantity 1 (one) Mica disk. Picture of Mica shown on sample mounting disk, model SD 101, not included.

Exchange/Return Notes
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  • Final sale items are not eligible for returns or exchanges.
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