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RTESPA-150 40 N/m -- Enables sample viewing after

SKU: 12374432898

4.4
USD293.08 USD335.08

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Description

-- Enables sample viewing after assembly

± 2NM CUMULATIVE PITCH 2σ UNCERTAIN

Optical Microscopy: reflected

This probe uses a rotated tip to provide a more symmetric representation of features over 200nm

The pattern height is approximately 15nm

RTESPA-150 40 N/m -- Enables sample viewing after5N m, 150kHz, Symmetric Tip, Al Reflex Coating, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of 10 High quality etched silicon probes for soft TappingMode and other non contact modes. Unmounted for use on standard AFM's. Bruker's flagship MPP probes are the preferred choice for high sensitivity silicon probe imaging in TappingMode or non contact mode in air. Every aspect of the MPP design has been optimized to provide the

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

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