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Critical Dimension (CD) Calibration Test Specimens for SEM, FIB, and AFM Type:Non-Certified The legacy MESP-HM is still

SKU: 11196753057

4.7
USD193.60 USD221.60

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Ships within 48 hours · Estimated delivery Aug 16 - Aug 21

Description

The legacy MESP-HM is still available for ordering while supplies last

These probesare ideal for C-AFM

and some adhesion and dissipation contrast as well

Material Code Copper C Nickel N Gold G Aluminum A Molybdenum M Titanium T Stainless Steel S

Bruker's new platinum silicide AFM probe is the ideal choice for Scanning Capacitance Microscopy measurements on the most advanced semiconductor features

Critical Dimension (CD) Calibration Test Specimens for SEM, FIB, and AFM Type:Non-Certified The legacy MESP-HM is stillDESCRIPTION "Critical Dimension (CD) structures" are particularly useful for SEM FIB magnification calibration and may be used for AFM. Microscopists and engineers using high performance SEMs or FIB systems will find this calibration test specimen useful. The 4. 8 x 4. 8mm silicon standard has a series of patterns with a side length of 480m around its edges, helpful for orientation. There are three versions available. Version with a 10 5 2 1 0. 5um

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

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